Xref: utzoo comp.lsi:1224 sci.electronics:15052
Path: utzoo!attcan!uunet!cs.utexas.edu!swrinde!zaphod.mps.ohio-state.edu!mips!hal!mark
From: mark@mips.COM (Mark G. Johnson)
Newsgroups: comp.lsi,sci.electronics
Subject: Re: Wanted: Electronic CTE Failure Data
Keywords: thermal mismatch, failure
Message-ID: <42189@mips.mips.COM>
Date: 17 Oct 90 20:23:35 GMT
References: <4553@trantor.harris-atd.com>
Sender: news@mips.COM
Reply-To: mark@mips.COM (Mark G. Johnson)
Followup-To: comp.lsi
Organization: MIPS Computer Systems, Inc.
Lines: 16

In article <4553@trantor.harris-atd.com> dmp@epg.harris.com (Donald Patterson) writes:
  > ... an expert system which would "design around" potential failures
  > due to thermal mismatch.

One source of data is Bob Widlar, linear designer extrordinaire.
He takes up the problem of unintentional voids in the thermal attachment:

   Robert J. Widlar, "Controlling Secondary Breakdown of Bipolar Power
   Transistors," Digest of Technical Papers, International Solid-State
   Circuits Conference (ISSCC) 1981, pp. 44-45.

   R. J. Widlar and M. Yamatake, "A 150W Opamp", ISSCC 1985, pp. 140-141.
-- 
 -- Mark Johnson	
 	MIPS Computer Systems, 930 E. Arques M/S 2-02, Sunnyvale, CA 94086
	(408) 524-8308    mark@mips.com  {or ...!decwrl!mips!mark}