Path: utzoo!censor!comspec!lethe!torsqnt!news-server.csri.toronto.edu!cs.utexas.edu!samsung!uakari.primate.wisc.edu!umriscc!mcs213k.cs.umr.edu!robf From: robf@mcs213k.cs.umr.edu (Rob Fugina) Newsgroups: sci.electronics Subject: Re: Transistor leakage current ? Message-ID: <2172@umriscc.isc.umr.edu> Date: 14 Feb 91 16:45:32 GMT References: <1973@gold.gvg.tek.com> Sender: news@umriscc.isc.umr.edu Organization: University of Missouri - Rolla Lines: 9 In article <1973@gold.gvg.tek.com> grege@gold.gvg.tek.com (Greg Ebert) writes: >device heating, and thus Icbo, thus Ic... It is possible to construct a >circuit which will have sufficient positive thermal feedback to self-destruct. > Would it be better to say that it's possible to construct a circuit which WON'T have sufficient positive thermal feedback to self-destruct? Me robf@cs.umr.edu