Xref: utzoo comp.lsi:1414 comp.theory:1698 comp.lang.vhdl:128 Path: utzoo!utgpu!news-server.csri.toronto.edu!cs.utexas.edu!uunet!mcsun!unido!unidui!veit From: veit@du9ds3.uni-duisburg.de (Holger Veit) Newsgroups: comp.lsi,comp.theory,comp.lang.vhdl Subject: Re: Call For Discussion: Comp.lsi.CAT Keywords: comp.lsi.cat Message-ID: Date: 25 Mar 91 12:07:10 GMT References: <3185@inews.intel.com> Sender: @unidui.uni-duisburg.de Organization: Rechenzentrum Uni-Duisburg Lines: 39 In <3185@inews.intel.com> bhoughto@pima.intel.com (Blair P. Houghton) writes: >In article veit@du9ds3.uni-duisburg.de (Holger Veit) writes: >>NAME: >> comp.lsi.cat >You never explained why "CAT" is the extension in the name of the group. >It would seem more appropriate to me that "ATE", for >"Automated Test Engineering", would be the most appropriate >extension, since the goal of all this vlsi test methodology >is automated test methods. >"ATE" is a widely-used acronym for this science. >So, how about "comp.lsi.ate"? > --Blair > "Just another ex-Sentry-20 > jock, wondering if FACTOR > ever got readable..." Ok, this seems to be an omission of myself. CAT is 'computer aided testing' and was chosen in correspondence to 'computer aided design' (comp.lsi.cad). Actually, there are a large number of so-called CA techniques (CAE,CAD,CAM, CAP,CASE etc.). In my knowledge, ATE is more used for E = EQUIPMENT, i.e. the tester machine itself; and the main goal intended to be discussed in this group is not only algorithms for automated testing, but more generally all aspects including modelling, design-for-testability, standards ...) But nevertheless: We have to overthink your proposal, beneath others like comp.lsi.testing, and I would like to hear the net's opinion. Holger Veit -- | | / Holger Veit | INTERNET: veit@du9ds3.uni-duisburg.de |__| / University of Duisburg | BITNET: veit%du9ds3.uni-duisburg.de@UNIDO | | / Fac. of Electr. Eng. | UUCP: ...!uunet!unido!unidui!hl351ge | |/ Dept. f. Dataprocessing |