Xref: utzoo comp.lsi:1415 comp.theory:1703 comp.lang.vhdl:129
Path: utzoo!utgpu!news-server.csri.toronto.edu!rpi!zaphod.mps.ohio-state.edu!sol.ctr.columbia.edu!emory!gatech!mcnc!unccvax!ee00crr
From: ee00crr@unccvax.uncc.edu (Ramesh C.R)
Newsgroups: comp.lsi,comp.theory,comp.lang.vhdl
Subject: Re: Call For Discussion: Comp.lsi.CAT
Keywords: comp.lsi.cat
Message-ID: <3297@unccvax.uncc.edu>
Date: 25 Mar 91 15:15:07 GMT
References: <veit.669557680@du9ds3>
Reply-To: ee00crr@unccvax.uncc.edu.UUCP (Ramesh C.R)
Followup-To: comp.lsi
Organization: University of North Carolina at Charlotte
Lines: 10

I am all for this newsgroup!! I thinks its high time that we recognize
 the impact of testing in the area of VLSI Design.  Testing has grown
well enough to be an entity in itself!!

 -Ramesh
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