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Path: utzoo!utgpu!news-server.csri.toronto.edu!cs.utexas.edu!uunet!pmafire!mica.inel.gov!sapphire!horne
From: horne@sapphire.idbsu.edu (cs354- Broward Horne)
Newsgroups: comp.lsi,comp.theory,comp.lang.vhdl
Subject: Re: Call For Discussion: Comp.lsi.CAT
Keywords: comp.lsi.cat
Message-ID: <1991Mar26.205904.1346@sapphire.idbsu.edu>
Date: 26 Mar 91 20:59:04 GMT
References: <veit.669557680@du9ds3> <3185@inews.intel.com>
Organization: Boise State University, Boise
Lines: 31

In article <3185@inews.intel.com> bhoughto@pima.intel.com (Blair P. Houghton) writes:
>
>It would seem more appropriate to me that "ATE", for
>"Automated Test Engineering", would be the most appropriate
>extension, since the goal of all this vlsi test methodology
>is automated test methods.
>
>"ATE" is a widely-used acronym for this science.
>
>So, how about "comp.lsi.ate"?
>
>				--Blair
>				  "Just another ex-Sentry-20
                                   ^^^^^^^^^^^^^^^^^^^^^^^^^^
   Well, it would appear you are MORE than a bizarro-engineerhead, Blair!
   You take good care of my 953's. Hopefully you have some technical skill
   as well as the B.S. degree :)


   I agree.   ATE is the accepted industry standard. By all means, use 
       
                ' comp.lsi.ate ' 

   See ya, Mr. ATE. I'm off to CAMland.


-- 
Broward Horne                 Coming this fall!  "Jack McVax$ is Back "
horne@sapphire.idbsu.edu      With his own Tokenring of 60 386's,           
an030@cleveland.freenet.cwru  and 1 AS/400 running MAPICTS CAM software.
                                  ha HA!      BE THERE!!!