Path: utzoo!utgpu!news-server.csri.toronto.edu!rpi!zaphod.mps.ohio-state.edu!swrinde!elroy.jpl.nasa.gov!decwrl!ucbvax!bloom-beacon!eru!hagbard!sunic!mcsun!hp4nl!duteca2!linden From: linden@duteca (J.Th.van der Linden) Newsgroups: comp.lsi Subject: Re: Call For Discussion: Comp.lsi.CAT Keywords: comp.lsi.cat Message-ID: <1276@duteca2.UUCP> Date: 4 Apr 91 08:30:20 GMT References: <3185@inews.intel.com> <1991Mar26.205904.1346@sapphire.idbsu.edu> Reply-To: linden@duteca2.UUCP (J.Th. van der Linden) Followup-To: comp.lsi Organization: Delft University of Technology, Dep. of Electrotechnical engineering. Lines: 11 In article <1991Mar26.205904.1346@sapphire.idbsu.edu> horne@sapphire.idbsu.edu (cs354- Broward Horne) writes: > I agree. ATE is the accepted industry standard. By all means, use > ' comp.lsi.ate ' I disagree, I perceive ATE as Automatic Test Equipment, as do many others. By no means use "comp.lsi.ate". I tend to dislike the name "comp.lsi.cat", and would prefer "comp.lsi.testing". That combination really can't give too much rise to incidental test-contributions of a different kind:-). BTW I'd welcome the new specialized newsgroup. van der Linden