Xref: utzoo sci.electronics:20287 rec.audio:31697 Path: utzoo!utgpu!news-server.csri.toronto.edu!rpi!think.com!spool.mu.edu!snorkelwacker.mit.edu!stanford.edu!agate!usenet.ins.cwru.edu!ysub!fc138001 From: FC138001@ysub.ysu.edu (Phil Munro) Newsgroups: sci.electronics,rec.audio Subject: Re: Transitor deterioration Message-ID: <91138.134831FC138001@ysub.ysu.edu> Date: 18 May 91 17:48:31 GMT Article-I.D.: ysub.91138.134831FC138001 References: <18030315@hpfcdj.HP.COM> <3961@polari.UUCP> <1991May16.194955.487@tc.fluke.COM> <1991May17.165228@IASTATE.EDU> Distribution: usa Organization: Youngstown State University VM system (YSUB) Lines: 15 >On a related topic: Will all transistors eventually become useless >chunks of silicon (or GaAs, or whatever) because of the extremely >slow, but nonzero diffusion of n into p and p into n at room >temperature? > Will all glass windows eventually become useless blobs of glass because of the liquid nature of glass?!!! I really don't have a quantitative answer to the question about Silicon, but the diffusion of dopant atoms in Si is something which is known, and as long as the temperature of the device is kept within specs, the mean time to failure would be known. In addition to these ideas about glass and design specs, we might want to note that EVERYTHING will melt down and be destroyed in the firey judgement to come. --Phil