Path: utzoo!utgpu!news-server.csri.toronto.edu!bonnie.concordia.ca!thunder.mcrcim.mcgill.edu!snorkelwacker.mit.edu!stanford.edu!agate!bionet!raven.alaska.edu!milton!payman From: payman@milton.u.washington.edu (Payman Arabshahi) Newsgroups: comp.ai.neural-nets Subject: Quality Control -- Neural networks Keywords: Neural Networks, Quality control, testing Message-ID: <1991Jun20.001828.23510@milton.u.washington.edu> Date: 20 Jun 91 00:18:28 GMT Organization: University of Washington Lines: 13 I would greatly appreciate it if somebody could be kind enough to send me or post in the newsgroup information/references about quality control using neural networks. I am interested in applying neural networks to the testing of electronic components. Many thanks; Payman Arabshahi payman@milton.u.washington.edu