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From: dave@rocksvax.UUCP (Dave Sewhuk)
Newsgroups: net.micro
Subject: Re: PAL Programmer sought
Message-ID: <442@rocksvax.UUCP>
Date: Tue, 15-May-84 14:44:46 EDT
Article-I.D.: rocksvax.442
Posted: Tue May 15 14:44:46 1984
Date-Received: Wed, 16-May-84 07:48:18 EDT
References: <3265@fortune.UUCP>
Organization: Xerox
Lines: 19

I use the Data I/O model 29 with the Programmable Logic Development System.
I re-wrote PALASM in C to automatically generate test vectors.  I also
wrote a simulator with this.  The original PALASM that I based this on did not
have a simulator, so I rolled my own.  The later PALASM seems to include
a batch oriented simulator, but I like mine better because it is
interactive and you don't have to generate a table of expected outputs.

I suggest whatever programmer you get include a way of performing a
functional test.  I have been "burned" a number of times with PALs that
pass the fuse test but don't function correctly.  The Data I/O stress
tests the device @ min and max Vcc spec during the functional test.  I
haven't seen a bad one in service since I started using these tests.
----
Down with Fortran......
-- 
Dave

Arpa: Sewhuk.HENR@PARC-MAXC.ARPA
uucp: {allegra, rochester, ritcv, ritvp, amd70, sunybcs}!rocksvax!dave