Relay-Version: version B 2.10 5/3/83; site utzoo.UUCP Posting-Version: version B 2.10.1 (Denver Mods 4/2/84) 6/24/83; site drutx.UUCP Path: utzoo!linus!decvax!tektronix!uw-beaver!cornell!vax135!houxm!ihnp4!drutx!qwerty From: qwerty@drutx.UUCP (JonesBD) Newsgroups: net.lsi Subject: Re: Self timed vs synchronous, lets discuss Message-ID: <1046@drutx.UUCP> Date: Thu, 6-Sep-84 13:11:26 EDT Article-I.D.: drutx.1046 Posted: Thu Sep 6 13:11:26 1984 Date-Received: Sun, 16-Sep-84 12:04:26 EDT References: <265@rochester.UUCP>, <18@sdcsvax.UUCP>, <3019@utah-cs.UUCP> <1393@wateng.UUCP> Organization: AT&T Information Systems Laboratories, Denver Lines: 7 Self timed circuits/chips become even more of a headache when used in larger circuits/assemblies. If no provision is made for external control of the self timing circuitry, the circuit becomes nearly untestable with any technique other than overall functional operation. This yields zero diagnostics when something is wrong. People who design/use self timed circuits without any provisions for testing manage to keep life interesting for those of us employed in the test area.