Relay-Version: version B 2.10 5/3/83; site utzoo.UUCP Posting-Version: version B 2.10.1 6/24/83; site umd5.UUCP Path: utzoo!watmath!clyde!burl!ulysses!allegra!bellcore!decvax!genrad!panda!talcott!harvard!seismo!umcp-cs!cvl!umd5!zben From: zben@umd5.UUCP Newsgroups: net.arch Subject: Re: Cube designs vs. x,y,z bus Message-ID: <344@umd5.UUCP> Date: Mon, 25-Feb-85 03:23:03 EST Article-I.D.: umd5.344 Posted: Mon Feb 25 03:23:03 1985 Date-Received: Thu, 28-Feb-85 01:16:12 EST References: <48@pbear.UUCP> <268@oliveb.UUCP> <342@umd5.UUCP> Reply-To: zben@umd5.UUCP (Ben Cranston) Organization: U of Md, CSC, College Park, Md Lines: 16 Summary: Oops, More In article <342@umd5.UUCP> zben@umd5.UUCP (Ben Cranston) writes: >So you might have to burn a map of the good processors into the chip after >testing, like those Intel mag bubble chips... Er, um, lets be charitable and say ZBEN wasn't really thinking when he said "Intel". He must have been thinking of the "T.I." bubble chips... And its even worse than that. A bad processor area could short one of the power supply rails, or (in the case of the Ethernet scheme) could flood the Enternet with bogus messages. The chip would probably have to have areas where a bad processor (identified during testing) could be electrically isolated from the power supply rails and the network connection, using a directed-energy beam to vaporize strategic areas of metallization. -- Ben Cranston ...seismo!umcp-cs!cvl!umd5!zben zben@umd2.ARPA