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From: fderavi@cybavax.UUCP (F. Deravi)
Newsgroups: net.physics,net.lsi
Subject: Auger spectroscopy of SiOx
Message-ID: <42@cybavax.UUCP>
Date: Wed, 20-Feb-85 08:19:01 EST
Article-I.D.: cybavax.42
Posted: Wed Feb 20 08:19:01 1985
Date-Received: Tue, 26-Feb-85 20:35:33 EST
Organization: University College Swansea, Wales
Lines: 13
Xref: watmath net.physics:2182 net.lsi:84


	We are seeing some large peak displacements ( up to 20 volts )
of the Si and Si-O 92 and 76 volt peaks. Displacement is a function of
primary beam angle. Could this be sample charging?

Mike Cooke.

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