Relay-Version: version B 2.10 5/3/83; site utzoo.UUCP Posting-Version: version B 2.10.2 9/13/84; site intelca.UUCP Path: utzoo!linus!philabs!prls!amdimage!amdcad!decwrl!sun!idi!intelca!kds From: kds@intelca.UUCP (Ken Shoemaker) Newsgroups: net.micro Subject: Re: Re: EPROM memory lifetime query Message-ID: <45@intelca.UUCP> Date: Tue, 27-Aug-85 16:55:18 EDT Article-I.D.: intelca.45 Posted: Tue Aug 27 16:55:18 1985 Date-Received: Fri, 30-Aug-85 00:36:47 EDT References: <649@wdl1.UUCP> Organization: Intel, Santa Clara, Ca. Lines: 22 > > ``EPROMS retain their data indefinitely''. Wrong. Fuse-blowing > PROMS may retain their data indefinitely, but the UV-erasable jobs do Also wrong, an unfortunate characteristic of programmable devices is a nasty tendency to grow back fuses after they are blown. This has never happened to me personally, but from all the press it gets (usually in the form that "our fuses have a much better chance of not growing back than generic manufacturer abc") I would think it to be somewhat of a problem. Note that I have never seen a semiconductor manufacturer boast about how much longer his EPROMs keep their memory over generic manufacturer abc... -- ...and I'm sure it wouldn't interest anybody outside of a small circle of friends... Ken Shoemaker, Microprocessor Design for a large, Silicon Valley firm {pur-ee,hplabs,amd,scgvaxd,dual,qantel}!intelca!kds ---the above views are personal. They may not represent those of the employer of its submitter.