Relay-Version: version B 2.10 5/3/83; site utzoo.UUCP Path: utzoo!mnetor!seismo!husc6!mit-eddie!genrad!decvax!decwrl!sun!cmcmanis From: cmcmanis@sun.uucp (Chuck McManis) Newsgroups: comp.sys.intel Subject: Re: POPF still broken in 286? Message-ID: <9778@sun.uucp> Date: Mon, 1-Dec-86 15:39:42 EST Article-I.D.: sun.9778 Posted: Mon Dec 1 15:39:42 1986 Date-Received: Tue, 2-Dec-86 02:07:47 EST References: <2646@gitpyr.gatech.EDU> <405@intsc.UUCP> <83@reality1.uucp> Organization: Sun Microsystems, Inc. Lines: 33 Summary: Huh? In article <83@reality1.uucp>, james@reality1.uucp (james) writes: > Well, what's the most current rev. level for the 80286, ie, how recent > should mine be to avoid all known bugs? Chip bugs are normally top secret, > but I assume the the current chip rev. level isn't sensitive. James, I don't think chip bugs are "top secret", ask your Intel sales rep for an Errata sheet. They can also generally tell you the current rev level or 'stepping' as the semiconducter trade likes to refer to it as. > > Well, gee, I can't think of any bugs in the MC68020 (not XC68020) offhand, > although the argument might be that they haven't been found yet, or that > Motorola has had better luck hiding them than Intel has had. Of course, > the 68000 did have the bug with the status register in which you could read > the priviledge level directly from user mode (although this was later > documented as a feature :-). Well gee, I bet you couldn't think of any '286 bugs offhand if you hadn't actually been bit by one. CPU's in general are getting so complicated that the time to test every transistor in a 32 bit CPU can often be measured in hours, one of the biggest challenges facing a Production Engineer is to get that testing time down as low as possible. And yes were bugs in the 68020, and consider that the '286 is both a CPU and a MMU in one package and compare it against the '020 and '451 or '851. It is all quite silly, 99% of the 'bugs' are so obscure that they are *never* seen by 99% of the users. For a sobering look at the problems of testing VLSI look at some of the recent Digital Design, EDN, and other technical mags. -- --Chuck McManis uucp: {anywhere}!sun!cmcmanis BIX: cmcmanis ARPAnet: cmcmanis@sun.com These opinions are my own and no one elses, but you knew that didn't you.