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From: mark@mips.UUCP (Mark G. Johnson)
Newsgroups: comp.lsi
Subject: Re: Soft Error rates in dynamic RAM
Message-ID: <709@obiwan.UUCP>
Date: Fri, 25-Sep-87 11:50:02 EDT
Article-I.D.: obiwan.709
Posted: Fri Sep 25 11:50:02 1987
Date-Received: Sun, 27-Sep-87 05:44:46 EDT
Lines: 22
Keywords: IEDM

In article <1309@leo.UUCP>, larry@leo.UUCP (Larry Johnson) writes
	> I am in the process of designing a DRAM for a chip set and
	> need to determine the soft error rate. The data I can't seem
	> to get my hands on is the alpha particle flux rate caused by
	> the package lid and the metal traces on the wafer.

	> Does anyone out there have typical numbers for this, and does
	> anyone have any good reference papers they could recommend.
	> Better still, did any of you write a paper on SER?

The best single source is the proceedings of the IEEE International
Electron Devices Meetings ("IEDM").  I strongly recommend this paper:

	Dennis Segers et al., "Circuit Design Methodologies for the
	Reduction of Alpha Soft Error Rate", IEDM Technical Digest,
	December 1983, pp. 331-5.

as it covers design and test issues for modern (i.e. VCC/2 bitline) dRAMs.
-- 
-Mark Johnson	*** DISCLAIMER: The opinions above are personal. ***	
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