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From: kc@hprndlb.HP.COM (Kurt Chan)
Newsgroups: comp.software-eng
Subject: Re: Looking for info on tools & techniques
Message-ID: <8950001@hprndlb.HP.COM>
Date: 12 Sep 88 16:58:36 GMT
References: <813@acer.stl.stc.co.uk>
Organization: HP Roseville Networks Division
Lines: 10

PODEM and FAN are algorithms which generate test vectors for digital
circuits to uncover stuck-at faults. GALPAT is typically used as a RAM test
and is of O(n**2). For a pointer to more references on these subjects, see 

   Pradhan, Dhiraj K.
   Fault Tolerant Computing, Theory and Techniques, Volume 1, Chapter 1
   Prentice-Hall, 1986

Kurt Chan
HP, Roseville Networks