Path: utzoo!attcan!uunet!vsi!friedl
From: friedl@vsi.COM (Stephen J. Friedl)
Newsgroups: comp.arch
Subject: Re: Testability Features
Summary: That's what customers are for
Message-ID: <970@vsi.COM>
Date: 17 Dec 88 20:16:59 GMT
References: <8453@bloom-beacon.MIT.EDU> <28200252@mcdurb>
Organization: V-Systems, Inc. -- Santa Ana, CA
Lines: 13

In article <28200252@mcdurb>, aglew@mcdurb.Urbana.Gould.COM writes:
> Most VLSI test methodology seems oriented towards detecting
> *implementation* or *fabrication* errors, not *design* errors.

Design errors are meant to be caught by customers :-)

     Steve

-- 
Stephen J. Friedl        3B2-kind-of-guy            friedl@vsi.com
V-Systems, Inc.                                 attmail!vsi!friedl
Santa Ana, CA  USA       +1 714 545 6442    {backbones}!vsi!friedl
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