Path: utzoo!utgpu!jarvis.csri.toronto.edu!mailrus!ames!ncar!noao!asuvax!mcdphx!mcdchg!clyde!tomo@floyd.ATT.COM
From: tomo@floyd.ATT.COM
Newsgroups: comp.arch
Subject: i860 - A question about built-in test features
Keywords: i860, n10, BIST
Message-ID: <42494@clyde.ATT.COM>
Date: 15 Mar 89 16:57:29 GMT
Sender: nuucp@clyde.ATT.COM
Lines: 4


I was told that the chip would include BIST and boundary scan features, 
however I have not seen any information posted here.
Does anyone have information on the built-in self test features of the i860?