Path: utzoo!utgpu!jarvis.csri.toronto.edu!cs.utexas.edu!uwm.edu!rpi!image.soe.clarkson.edu!sunybcs!palumbo From: palumbo@cs.Buffalo.EDU (Paul Palumbo) Newsgroups: comp.graphics Subject: Connected Component Algorithm Message-ID: <15695@eerie.acsu.Buffalo.EDU> Date: 11 Jan 90 19:10:35 GMT Sender: nobody@acsu.Buffalo.EDU Reply-To: palumbo@cs.Buffalo.EDU (Paul Palumbo) Organization: SUNY/Buffalo Computer Science Lines: 28 I was wondering if anybody out there in net-land knows an image analysis technique to locate connected components in digital images. In particular, I am looking for an algorithm that can be implemented in hardware that makes only one pass through the image in scan-line order and reports several simple component features such as component extent (Minimum and Maximum X and Y coordinates) and the number of foreground pixels in the component. The project I am on is planning to design and develop custom image analysis hardware to do this. We have developed an algorithm locally and was wondering if somebody else has an easier method. I know about the LSI Logic "Object Contour Tracer Chip" but this chip appears to be too powerful (and slow) for this application. I had found some papers by Gleason and Agin dated about 10 years ago but could not find the exact details of their algorithm. Does anybody else have a need for such hardware? Any help or pointers on locating such an algorithm would be appreciated. Paul Palumbo internet:palumbo@cs.buffalo.edu Research Associate bitnet: palumbo@sunybcs.BITNET 226 Bell Hall csnet: palumbo@buffalo.csnet SUNY at Buffalo CS Dept. Buffalo, New York 14260 (716) 636-3407 uucp: ..!{boulder,decvax,rutgers}!sunybcs!palumbo